Seeing beyond the naked eye has been a reality for many
years, but seeing at the nano-level is a recent science with many implications
for business. When it comes to fluid power and many other areas, seeing the
most minute particles can find answers that otherwise are unfathomable.
Research and education at the nano-scale is becoming more critical each year as research and development focuses on nano-scale phenomena, ultrafine structures and interfaces between matter. Atomic Force Microscopy ("AFM") allows the force between a small tip and a chosen sample surface to be measured with atomic-scale resolution. Initially lateral forces between the tip and the sample can also be measured to better understand the origins of friction at the molecular scale.
Other types of AFM surface measurement models
include: plastic deformations, electrical conductivity and thermal
conductivity. All these capabilities make the AFM an indispensable tool for
characterization and manipulation in all areas of the emerging field of
technology called nanotechnology. Leveraging the state-of-the-art AFM
capabilities, research will be conducted in the areas of wear reduction and
surface enhancement. Other areas include Solid Freeform Fabrication (SFF) of
metal matrix composites and numerous projects for biological and industrial
applications (e.g., MEMS).